Публикации лаборатории
Последнее обновление: 08.11.2022
Всего публикаций: 62
Всего публикаций: 62
#2018
Laser and Photonics Reviews, vol. 12(1), pp. 1700227 , 2018
[DOI:10.1002/lpor.201700227] [IF:11.52] [SJR:4.014] [Q1]
Physica Status Solidi (A) Applications and Materials Science, vol. 215(21), pp. 1800046 , 2018
[DOI:10.1002/pssa.201800046] [IF:1.86] [SJR:0.527] [Q2]
Physica Status Solidi — Rapid Research Letters, vol. 12(1), pp. 1700358 , 2018
[DOI:10.1002/pssr.201700358] [IF:5.29] [SJR:0.893] [Q1]
Nano Letters, vol. 18(1), pp. 535—539 , 2018
[DOI:10.1021/acs.nanolett.7b04542] [IF:11.63] [SJR:5.786] [Q1]
Scientific Reports, vol. 8(1), pp. 5299 , 2018
[DOI:10.1038/s41598-018-23687-7] [IF:4.15] [SJR:1.341] [Q1]
CrystEngComm, vol. 20(24), pp. 3370—3380 , 2018
[DOI:10.1039/c8ce00348c] [IF:3.18] [SJR:0.814] [Q1]
Journal of Renewable and Sustainable Energy, vol. 10(2), pp. 21001 , 2018
[DOI:10.1063/1.5000256] [IF:1.81] [SJR:0.483] [Q3]
Journal of Applied Physics, vol. 123(16), pp. 161418 , 2018
[DOI:10.1063/1.5011371] [IF:2.42] [SJR:0.728] [Q2]
Journal of Applied Physics, vol. 124(16), pp. 163102 , 2018
[DOI:10.1063/1.5046823] [IF:2.42] [SJR:0.728] [Q2]
AIP Conference Proceedings, vol. 2012(1), pp. 40005 , 2018
[DOI:10.1063/1.5053513] [IF:0.42] [SJR:0.19]
AIP Conference Proceedings, vol. 2012(1), pp. 40010 , 2018
[DOI:10.1063/1.5053518] [IF:0.42] [SJR:0.19]
Semiconductors, vol. 52(16), pp. 2096—2098 , 2018
[DOI:10.1063/1.5087668] [IF:0.76] [SJR:0.298] [Q3]
Journal of Physics: Conference Series, vol. 1038(1), pp. 12053 , 2018
[DOI:10.1088/1742-6596/1038/1/012053] [IF:0.6] [SJR:0.227] [Q3]
Journal of Physics: Conference Series, vol. 1038(1), pp. 12108 , 2018
[DOI:10.1088/1742-6596/1038/1/012108] [IF:0.6] [SJR:0.227] [Q3]
Journal of Physics: Conference Series, vol. 1092(1), pp. 12013 , 2018
[DOI:10.1088/1742-6596/1092/1/012013] [IF:0.6] [SJR:0.227] [Q3]
Journal of Physics: Conference Series, vol. 1092(1), , 2018
[DOI:10.1088/1742-6596/1092/1/012140] [IF:0.6] [SJR:0.227] [Q3]
Journal of Physics: Conference Series, vol. 1124(2), pp. 22009 , 2018
[DOI:10.1088/1742-6596/1124/2/022009] [IF:0.6] [SJR:0.227] [Q3]
Journal of Physics: Conference Series, vol. 1124(2), pp. 22033 , 2018
[DOI:10.1088/1742-6596/1124/2/022033] [IF:0.6] [SJR:0.227] [Q3]
Journal of Physics: Conference Series, vol. 1124(2), pp. 22042 , 2018
[DOI:10.1088/1742-6596/1124/2/022042] [IF:0.6] [SJR:0.227] [Q3]
Journal of Physics: Conference Series, vol. 1124(4), pp. 41010 , 2018
[DOI:10.1088/1742-6596/1124/4/041010] [IF:0.6] [SJR:0.227] [Q3]
Journal of Physics: Conference Series, vol. 1124(4), pp. 41017 , 2018
[DOI:10.1088/1742-6596/1124/4/041017] [IF:0.6] [SJR:0.227] [Q3]
Journal of Physics: Conference Series, vol. 1124(4), pp. 41018 , 2018
[DOI:10.1088/1742-6596/1124/4/041018] [IF:0.6] [SJR:0.227] [Q3]
Journal of Physics: Conference Series, vol. 1124(4), pp. 41031 , 2018
[DOI:10.1088/1742-6596/1124/4/041031] [IF:0.6] [SJR:0.227] [Q3]
Journal of Physics: Conference Series, vol. 1124(4), pp. 41034 , 2018
[DOI:10.1088/1742-6596/1124/4/041034] [IF:0.6] [SJR:0.227] [Q3]
Journal of Physics: Conference Series, vol. 1124(4), pp. 41035 , 2018
[DOI:10.1088/1742-6596/1124/4/041035] [IF:0.6] [SJR:0.227] [Q3]
Journal of Physics: Conference Series, vol. 1124(4), pp. 41036 , 2018
[DOI:10.1088/1742-6596/1124/4/041036] [IF:0.6] [SJR:0.227] [Q3]
Journal of Physics: Conference Series, vol. 1124(4), pp. 41039 , 2018
[DOI:10.1088/1742-6596/1124/4/041039] [IF:0.6] [SJR:0.227] [Q3]
Journal of Physics: Conference Series, vol. 1124(4), pp. 41040 , 2018
[DOI:10.1088/1742-6596/1124/4/041040] [IF:0.6] [SJR:0.227] [Q3]
Journal of Physics: Conference Series, vol. 1124(4), pp. 41042 , 2018
[DOI:10.1088/1742-6596/1124/4/041042] [IF:0.6] [SJR:0.227] [Q3]
Journal of Physics: Conference Series, vol. 1124(7), pp. 71023 , 2018
[DOI:10.1088/1742-6596/1124/7/071023] [IF:0.6] [SJR:0.227] [Q3]
Journal of Physics: Conference Series, vol. 1124(8), pp. 81023 , 2018
[DOI:10.1088/1742-6596/1124/8/081023] [IF:0.6] [SJR:0.227] [Q3]
Journal of Physics: Conference Series, vol. 1135(1), pp. 12040 , 2018
[DOI:10.1088/1742-6596/1135/1/012040] [IF:0.6] [SJR:0.227] [Q3]
Journal of Physics: Conference Series, vol. 993(1), pp. 1 , 2018
[DOI:10.1088/1742-6596/993/1/012023] [IF:0.6] [SJR:0.227] [Q3]
Journal of Physics: Conference Series, vol. 993(1), pp. 12030 , 2018
[DOI:10.1088/1742-6596/993/1/012030] [IF:0.6] [SJR:0.227] [Q3]
Journal of Physics: Conference Series, vol. 1124(4), pp. 41021 , 2018
[DOI:10.1088/1742-6596/993/1/012034] [IF:0.6] [SJR:0.227] [Q3]
Physical Review B, vol. 97(19), pp. 195443 , 2018
[DOI:10.1103/PhysRevB.97.195443] [IF:3.58] [SJR:1.811] [Q1]
Physical Review Letters, vol. 120(25), pp. 257203 , 2018
[DOI:10.1103/PhysRevLett.120.257203] [IF:8.45] [SJR:3.588] [Q1]
Journal of Applied Crystallography, vol. 51(4), pp. 1069—1081 , 2018
[DOI:10.1107/S1600576718007823] [IF:2.89] [SJR:1.525] [Q1]
Proceedings — International Conference Laser Optics 2018, ICLO 2018 pp. 429 , 2018
[DOI:10.1109/LO.2018.8435781]
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, vol. 36(2), pp. 021302 , 2018
[DOI:10.1116/1.4999409]
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, vol. 36(2), pp. 02D408 , 2018
[DOI:10.1116/1.5018259]
None, vol. 10721, pp. 13 , 2018
[DOI:10.1117/12.2321281]
JETP Letters, vol. 107(1), pp. 10—14 , 2018
[DOI:10.1134/S0021364018010083] [IF:1.49] [SJR:0.583] [Q2]
JETP Letters, vol. 108(3), pp. 201—204 , 2018
[DOI:10.1134/S0021364018150109] [IF:1.49] [SJR:0.583] [Q2]
Semiconductors, vol. 52(3), pp. 383—389 , 2018
[DOI:10.1134/S1063782618030028] [IF:0.76] [SJR:0.298] [Q3]
Semiconductors, vol. 52(4), pp. 497—501 , 2018
[DOI:10.1134/S1063782618040206] [IF:0.76] [SJR:0.298] [Q3]
Semiconductors, vol. 52(4), pp. 489—492 , 2018
[DOI:10.1134/S1063782618040231] [IF:0.76] [SJR:0.298] [Q3]
Semiconductors, vol. 52(5), pp. 609—611 , 2018
[DOI:10.1134/S1063782618050020] [IF:0.76] [SJR:0.298] [Q3]
Semiconductors, vol. 52(13), pp. 1775—1781 , 2018
[DOI:10.1134/S1063782618130092] [IF:0.76] [SJR:0.298] [Q3]
Semiconductors, vol. 52(14), pp. 1833—1835 , 2018
[DOI:10.1134/S1063782618140026] [IF:0.76] [SJR:0.298] [Q3]
Semiconductors, vol. 52(14), pp. 1809—1812 , 2018
[DOI:10.1134/S106378261814021X] [IF:0.76] [SJR:0.298] [Q3]
Semiconductors, vol. 52(16), pp. 2088—2091 , 2018
[DOI:10.1134/S1063782618160054] [IF:0.76] [SJR:0.298] [Q3]
Semiconductors, vol. 52(16), pp. 2092—2095 , 2018
[DOI:10.1134/S106378261816008X] [IF:0.76] [SJR:0.298] [Q3]
Physics of the Solid State, vol. 60(4), pp. 691—694 , 2018
[DOI:10.1134/S1063783418040261] [IF:0.99] [SJR:0.386] [Q3]
Technical Physics Letters, vol. 44(2), pp. 133—136 , 2018
[DOI:10.1134/S1063785018020244] [IF:1.01] [SJR:0.446] [Q2]
Nanosystems: Physics, Chemistry, Mathematics, vol. 9(5), pp. 609—613 , 2018
[DOI:10.17586/2220-8054-2018-9-5-609-613]
Nanosystems: Physics, Chemistry, Mathematics, vol. 9(6), pp. 789—792 , 2018
[DOI:10.17586/2220-8054-2018-9-6-789-792]
Beilstein Journal of Nanotechnologyopen, vol. 20(24), pp. 3370—3380 , 2018
[DOI:10.3762/bjnano.9.17] [IF:2.4] [SJR:0.72] [Q1]
Semiconductors, vol. 52(4), , 2018
Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials.—Ekaterinburg, 2019 pp. 65 , 2018